Abstract: technology inspection of electronic components，this paper proposes a simulation design of an AI-based inspection platform. The platform adopts a three-layer architecture of virtual generation-intelligent detection-interactive verification：it generates high- fidelity synthetic data with automatic annotation through physically-based rendering and parametric digital twin modeling；designs a lightweight incremental learning strategy to achieve accurate real-time detection under few-shot conditions while suppressing catastrophic forgetting；and builds an interactive layer with visual monitoring，dynamic evaluation，and parameter tuning to support closed-loop debugging and stress testing. Simulations show that the synthetic data closely match the real distribution，and the platform outperforms traditional methods in detection rate and false alarm rate，with significantly faster convergence under few-shot scenarios， offering a reference for a low-cost，high-efficiency，and self-evolving intelligent inspection solution.